12

Multivariate image analysis methods applied to XPS imaging data sets

Year:
2002
Language:
english
File:
PDF, 540 KB
english, 2002
13

XPS analysis of FIB-milled Si

Year:
2002
Language:
english
File:
PDF, 331 KB
english, 2002
16

Quantitation of coverages on rough surfaces by XPS: An overview

Year:
1988
Language:
english
File:
PDF, 625 KB
english, 1988
17

Determination of overlayer thickness by angle-resolved XPS: A comparison of algorithms

Year:
1993
Language:
english
File:
PDF, 1.62 MB
english, 1993